{"abstract":"The National Institute of Standards and Technology (NIST) will hold a public meeting to discuss U.S. technical participation in the 11th Quadrennial Conference of the International Organization of Legal Metrology (OIML). The pre-conference public meeting is open to all interested parties. The principal focus will be on 15 OIML Recommendations on legal measuring instruments that will be presented for ratification by the Conference. These Recommendations and OIML-member nations' technical comments on them will be reviewed with interested parties who will be given an opportunity to present their views on the Recommendations and other relevant issues of the Conference. Participants with an expressed interest in particular topics may obtain copies of the OIML Conference technical agenda, including copies of the Recommendations to be ratified. Interested parties should schedule oral presentations for the pre-conference meeting, providing a written summary of comments, no later than 22 September 2000 with the NIST Technical Standards Activities Program. Written comments are welcome at any time.","action":"Meeting Announcement.","agencies":[{"raw_name":"DEPARTMENT OF COMMERCE","name":"Commerce Department","id":54,"url":"https://www.federalregister.gov/agencies/commerce-department","json_url":"https://www.federalregister.gov/api/v1/agencies/54","parent_id":null,"slug":"commerce-department"},{"raw_name":"National Institute of Standards and Technology","name":"National Institute of Standards and Technology","id":352,"url":"https://www.federalregister.gov/agencies/national-institute-of-standards-and-technology","json_url":"https://www.federalregister.gov/api/v1/agencies/352","parent_id":54,"slug":"national-institute-of-standards-and-technology"}],"body_html_url":"https://www.federalregister.gov/documents/full_text/html/2000/08/24/00-21622.html","cfr_references":[],"citation":"65 FR 51589","comment_url":null,"comments_close_on":null,"correction_of":null,"corrections":[],"dates":"Pre-conference meeting at the National Institute of Standards and Technology: 26 September 2000 from 10:00 a.m. to 12:00 noon; Eleventh OIML International Conference of Legal Metrology in London, England: 9-13 October 2000.","disposition_notes":null,"docket_ids":[],"dockets":[],"document_number":"00-21622","effective_on":null,"end_page":51590,"executive_order_notes":null,"executive_order_number":null,"explanation":null,"full_text_xml_url":"https://www.federalregister.gov/documents/full_text/xml/2000/08/24/00-21622.xml","html_url":"https://www.federalregister.gov/documents/2000/08/24/00-21622/public-meeting-on-us-technical-participation-in-11th-quadrennial-conference-of-the-international","images":{},"images_metadata":{},"json_url":"https://www.federalregister.gov/api/v1/documents/00-21622?publication_date=2000-08-24","mods_url":"https://www.govinfo.gov/metadata/granule/FR-2000-08-24/00-21622/mods.xml","not_received_for_publication":null,"page_length":2,"page_views":{"count":21,"last_updated":"2026-04-04 18:15:03 -0400"},"pdf_url":"https://www.govinfo.gov/content/pkg/FR-2000-08-24/pdf/00-21622.pdf","presidential_document_number":null,"proclamation_number":null,"public_inspection_pdf_url":null,"publication_date":"2000-08-24","raw_text_url":"https://www.federalregister.gov/documents/full_text/text/2000/08/24/00-21622.txt","regulation_id_number_info":{},"regulation_id_numbers":[],"regulations_dot_gov_info":{},"regulations_dot_gov_url":null,"significant":null,"signing_date":null,"start_page":51589,"subtype":null,"title":"Public Meeting on U.S. Technical Participation in 11th Quadrennial Conference of the International Organization of Legal Metrology (OIML)","toc_doc":"International Organization of Legal Metrology, U.S technical participation in 11th Quadrennial Conference","toc_subject":"Meetings:","topics":[],"type":"Notice","volume":65}