This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Suite 4100W, Franklin Court Building, U.S. Department of Commerce, 1099 14th Street, NW., Washington, DC.
Docket Number: 03-018. Applicant: University of North Carolina at Chapel Hill, Chapel Hill, NC 27599-7295. Instrument: Electron Microscope, Model Tecnai G2 12 TWIN. Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at 68 FR 23979, May 6, 2003. Order Date: May 7, 2002.
Docket Number: 03-020. Applicant: Wayne State University, Detroit, MI 48202. Instrument: Electron Microscope, Model JEM-2010 FasTEM. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 68 FR 23979, May 6, 2003. Order Date: December 5, 2002.
Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as these instruments are intended to be used, was being manufactured in the United States at the time the instruments were ordered. Reasons: Each foreign instrument is a conventional transmission electron microscope (CTEM) and is intended for research or scientific educational uses requiring a CTEM. We know of no CTEM, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of each instrument.Start Signature
Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. 03-14342 Filed 6-5-03; 8:45 am]
BILLING CODE 3510-DS-P