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This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 A.M. and 5:00 P.M. in Suite 4100W, Franklin Court Building, U.S. Department of Commerce, 1099 14th Street, NW, Washington, D.C.

Docket Number: 05-016. Applicant: Lawrence Livermore National Laboratory, Livermore, CA 94550. Instrument: Electron Microscope, Model Technai G2 F20 S-TWIN. Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at 70 FR 25016, May 12, 2005. Order Date: January 30, 2005.

Docket Number: 05-019 Applicant: The University of Texas at

Austin, Texas Materials Institute, Austin, TX 78712. Instrument: Electron Microscope, Model Technai G2 F20 X-TWIN. Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at 70 FR 25016, May 12, 2005. Order Date: November 8, 2004.

Docket Number: 05-022. Applicant: The Mayo Clinic, Rochester, MN 55905. Instrument: Electron Microscope, Model Technai G2 12 TWIN. Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at 70 FR 25016, May 12, 2005. Order Date: August 2, 2004.

Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as these instruments are intended to be used, was being manufactured in the United States at the time the instruments were ordered. Reasons: Each foreign instrument is a conventional transmission electron microscope (CTEM) and is intended for research or scientific educational uses requiring a CTEM. We know of no CTEM, or any other instrument suited to these purposes, which was being manufactured in the United States either at the time of order of each instrument OR at the time of receipt of application by U.S. Customs and Border Protection.

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