This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 A.M. and 5:00 P.M. in Suite 4100W, Franklin Court Building, U.S. Department of Commerce, 1099 14th Street, NW, Washington, D.C.
Docket Number: 05-032. Applicant: State University of New York, Stony Brook. Instrument: Electron Microscope, Model JEM-2200FS. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 70 FR 48372, August 17, 2005. Order Date: September 2, 2003.
Docket Number: 05-034. Applicant: The University of Southern Mississippi, Hattiesburg. Instrument: Electron Microscope, Model JEM-2100. Manufacturer: JEOL, Ltd., Japan. Intended Use:See notice at 70 FR 48372, August 17, 2005. Order Date: October 13, 2004.
Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as these instruments are intended to be used, was being manufactured in the United Start Printed Page 61604States at the time the instruments were ordered. Reasons: Each foreign instrument is a conventional transmission electron microscope (CTEM) and is intended for research or scientific educational uses requiring a CTEM. We know of no CTEM, or any other instrument suited to these purposes, which was being manufactured in the United States either at the time of order of each instrument OR at the time of receipt of application by U.S. Customs and Border Protection.Start Signature
Gerald A. Zerdy,
Program Manager Statutory Import Programs Staff.
[FR Doc. E5-5893 Filed 10-24-05; 8:45 am]
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