Pursuant to section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether an instrument of equivalent scientific value, for the purposes for which the instrument shown below is intended to be used, is being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be filed within 20 days with the Statutory Import Programs Staff, U.S. Department of Commerce, Washington, DC 20230. Applications may be examined between 8:30 a.m. and 5 p.m. in Suite 4100W, U.S. Department of Commerce, Franklin Court Building, 1099 14th Street, NW., Washington, DC.Start Printed Page 9652
Docket Number: 02-004.
Applicant: University of California, Lawrence Berkeley National Laboratory, Procurement 937-200, One Cyclotron Road, Berkeley, CA 94720.
Instrument: Electron Microscope, Model JEM-2010.
Manufacturer: JEOL Ltd., Japan.
Intended Use: The instrument is intended to be used to study carbon and inorganic nanotubes, nanowires and nanoscale electrical and mechanical devices. It will also be used to measure mechanical properties as the Young modulus, and yield strength and failure modes of single nanotubes.
Application accepted by Commissioner of Customs: February 13, 2002.Start Signature
Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. 02-5109 Filed 3-1-02; 8:45 am]
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