Department of the Navy, DOD.
The invention listed below is assigned to the United States Government as represented by the Secretary of the Navy and is available for licensing by the Department of the Navy. Patent application 10/975,126: Backplane Tester and Method of Use. This is a low-cost robust backplane test system that is compact, easy-to-use, and simple to manufacture. It is not encumbered by other features and add-ons, which may act as constraints to the test system and be complex to use, larger and more expensive.
Requests for copies of the invention cited should be directed to the Naval Surface Warfare Center, Crane Div, Code 054, Bldg 1, 300 Highway 361, Crane, IN 47522-5001.Start Further Info
FOR FURTHER INFORMATION CONTACT:
Mr. Brian Bailey, Naval Surface Warfare Center, Crane Div, Code 054, Bldg 1, 300 Highway 361, Crane, IN 47522-5001, telephone (812) 854-2378. To download an application for license, see: http://www.crane.navy.mil/newscommunity/techtrans_CranePatents.asp.Start Printed Page 67554 Start Signature
Dated: November 8, 2004.
J. H. Wagshul,
Commander, Judge Advocate General's Corps, U.S. Navy, Federal Register Liaison Officer.
[FR Doc. 04-25546 Filed 11-17-04; 8:45 am]
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