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University of Southern California, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes

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This is a decision consolidated pursuant to section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Room 2104, U.S. Department of Commerce, 14th and Constitution Avenue., NW., Washington, DC.

Docket Number: 07-047. Applicant: University of Southern California, Los Angeles, CA. Instrument: Electron Microscope, Model JEM-1400. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 72 FR 46037, August 16, 2007.

Docket Number: 07-050. Applicant: University of Massachusetts Medical School, Worcester, MA. Instrument: Electron Microscope, Model Quanta 200 FEG. Manufacturer: FEI, Company, Czech Republic. Intended Use: See notice at 72 FR 46037, August 16, 2007.

Docket Number: 07-049. Applicant: Indiana University. Instrument: Electron Microscope, Model JEM-3200FS. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 72 FR 46037, August 16, 2007.

Docket Number: 06-042. Applicant: The University of Illinois at Urbana-Champaign, Champaign, IL. Instrument: Electron Microscope, Model JEM-2200FS. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 72 FR 46037, August 16, 2007.

Docket Number: 07-052. Applicant: Scripps Research Institute, La Jolla, CA. Instrument: Electron Microscope, (2), Tecnai G2 Spirit TWIN and Morgagni TEM. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 72 FR 46037, August 16, 2007.

Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as these instruments are intended to be used, was being manufactured in the United States at the time the instruments were ordered. Reasons: Each foreign instrument is an electron microscope and is intended for research or scientific educational uses requiring an electron microscope. We know of no electron microscope, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of each instrument.

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Faye Robinson,

Director, Statutory Import Programs Staff, Import Administration.

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[FR Doc. E7-17867 Filed 9-10-07; 8:45 am]

BILLING CODE 3510-DS-P