Pursuant to Section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether instruments of equivalent scientific value, for the purposes for which the instruments shown below are intended to be used, are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be postmarked on or before May 4, 2009. Address written comments to Statutory Import Programs Staff, Room 3720, U.S. Department of Commerce, Washington, D.C. 20230. Applications may be examined between 8:30 A.M. and 5:00 P.M. at the U.S. Department of Commerce in Room 3720.
Docket Number: 09-008. Applicant: National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899. Instrument: Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: The instrument will be used to study the compositional characterization of complex, compositionally heterogeneous materials at the sub-nanometer scale. This includes materials such as advanced on-chip interconnects, semiconductor nanowires and thin film and other nano-structured materials. Justification for Duty-Free Entry: No instruments of the same general category as the foreign instrument begin manufactured in the United States. Application accepted by Commissioner of Customs: March 17, 2009.Start Signature
Dated: April 6, 2009.
Acting Director, IA Subsidies Enforcement Office.
[FR Doc. E9-8396 Filed 4-10-09; 8:45 am]
BILLING CODE: 3510-DS-S